1. Wafer-level testing and test during burn-in for integrated circuits / Sudarshan Bahukudumbi, Krishnendu Chakrabarty
پدیدآورنده : Bahukudumbi, Sudarshan.
کتابخانه: Library and Information Center of Ayatollah Imani of Salman Farsi University (Fars)
موضوع : Integrated circuits, Testing,Integrated circuits, Wafer-scale integration,Semiconductors, Testing
رده :
TK
7874
.
B22W3
2010
